JPH0438307Y2 - - Google Patents
Info
- Publication number
- JPH0438307Y2 JPH0438307Y2 JP18933786U JP18933786U JPH0438307Y2 JP H0438307 Y2 JPH0438307 Y2 JP H0438307Y2 JP 18933786 U JP18933786 U JP 18933786U JP 18933786 U JP18933786 U JP 18933786U JP H0438307 Y2 JPH0438307 Y2 JP H0438307Y2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- test
- test head
- measuring
- switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 35
- 239000004065 semiconductor Substances 0.000 claims description 19
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 4
- 239000011159 matrix material Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18933786U JPH0438307Y2 (en]) | 1986-12-09 | 1986-12-09 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18933786U JPH0438307Y2 (en]) | 1986-12-09 | 1986-12-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6393576U JPS6393576U (en]) | 1988-06-16 |
JPH0438307Y2 true JPH0438307Y2 (en]) | 1992-09-08 |
Family
ID=31141543
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18933786U Expired JPH0438307Y2 (en]) | 1986-12-09 | 1986-12-09 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0438307Y2 (en]) |
-
1986
- 1986-12-09 JP JP18933786U patent/JPH0438307Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6393576U (en]) | 1988-06-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0285799A3 (en) | Device for the functional electric testing of wiring arrays, in particular of circuit boards | |
JPH0438307Y2 (en]) | ||
JP3631275B2 (ja) | 半導体試験装置のピン試験回路 | |
RU2751647C1 (ru) | Аналоговый коммутатор источников-измерителей с тестируемыми полупроводниковыми приборами | |
JPH052869Y2 (en]) | ||
JPH01129432A (ja) | 集積回路 | |
JP3436138B2 (ja) | 半導体試験装置用バイアス電源回路 | |
SE8504098D0 (sv) | Anordning for att undersoka korrekt funktionering hos ett slirningsreglerat bromssystem | |
JPS61241673A (ja) | Ic試験装置 | |
JP2001153902A (ja) | 抵抗測定方法 | |
JP3461258B2 (ja) | 導電率またはpHを測定する装置 | |
JP2579883Y2 (ja) | Ic搬送装置用試験装置 | |
JPH0539496Y2 (en]) | ||
JPH076540Y2 (ja) | 回路動作試験装置 | |
JPH0232077U (en]) | ||
JPH0365987U (en]) | ||
RU16973U1 (ru) | Испытательный прибор | |
JP4493776B2 (ja) | 集積回路装置用のテスト装置 | |
JPH02234077A (ja) | リレーマトリックスの接地回路 | |
SU134140A1 (ru) | Способ измерени напр жений в авиационных винтах при соосной схеме их включени | |
JPS62145170U (en]) | ||
JPH0365674A (ja) | 半導体試験方法 | |
JPS6221069A (ja) | コンタクト式マルチプロ−ブ | |
JPH0422306Y2 (en]) | ||
JPH04148540A (ja) | 集積回路試験装置 |